SUBJECT CATEGORY : Computer Science Engg., Information Technology, Electronic and Telecommunication Engineering, Electrical Engineering

Volume 9, Issue 12, December 2019 ( ISSN 2250 – 2459 (Online))

An ISO 9001:2008 Certified Journal

S.No.

Title of Paper

Page No.
1.

Modeling of Fincha’a-Amarti-Nashe Reservoir Operation Using Hydrologic Engineering Center Reservoir Simulation (HEC-RESSIM)

Authors: Misgana Lamessa Dinsa, Vighneswara Rao. K

1-8
2.

Selection of Slip Compensation Technique in Three Phase Induction Motors Drive Systems

Authors: Hussein Sarhan, Rateb Issa

9-15
3.

Numerical Investigation of Turbulent Mixing for Autoignition in Stratified Mixture and Temperature Inhomogeneity Relevant to HCCI Combustion

Authors: Soma Chakraborty, Dipal Patel

16-22
4.

A Research Study on Market Basket Analysis Using to Improve ARM and Correlation Properties Measures

Authors: Dr. Mani Sarma Vittapu

23-27
5.

Design and Implementation of Recursive Feature Reduction Gene Analysis for T2DM without TCF7L2 Gene

Authors: Dr. K. Vijayalakshmi

28-33
6.

Implementation of Neural Network and Retrieval of Multimedia Files Using Data Hiding Technique

Authors: Komal Tahiliani, Dr. Azad Kumar Shrivastava

34-39
7.

Risk associated with Radio Frequency Identification (RFID) Technology in FASTag

Author: Dr. Ashwini Kumar Srivastava

40-47
8.

Facial Expressions Techniques using Image Processing

Author: Prof. Girisha Ramhari Bombale

48-52
9.

Design and Development of Environment Sensing Parameters

Authors: Nidhi Kokande, Russell Pinto, Swarup Shirbhate, Chinmay Pathak

53-56
10.

Well Log Analysis and Petrophysical Study in Passive Rift Margin

Author: Janifar Hakim Lupin

57-69
11.

Overview and Extensions of the High Efficiency Video Coding (HEVC) and Beyond (Versatile Video

Authors: Shreyanka Subbarayappa, K.R.Rao

70-97
12.

MoSe2 Deposition on Multiple Substrates using Chemical Bath Deposition and its Characterization using Scanning Electron Microscopy

Authors: Sayak Mukherjee, Anik Mukherjee

98-104
13.

Scanning Electron Microscopy Study of CVD grown MoSe2 on Copper and Silicon Wafers

Authors: Sayak Mukherjee, Anik Mukherjee

105-108